Regulating phase change behavior and surface characteristics of Sn15Sb85 thin film by oxygen doping

Regulating phase change behavior and surface characteristics of Sn15Sb85 thin film by oxygen doping

摘要：

The resistance as a function of temperature (R–T) was measured using the in situ measurement with a heating rate of 10 °C min−1. The sample temperature was measured by a Pt-100 thermocouple located at a heating stage controlled by a TP 94 temperature controller (Linkam Scientific Instruments Ltd, Surrey, UK). The optical band gap was measured by NIR spectrophotometer. The phase structures of the films annealed at various temperatures were investigated by x-ray diffraction (XRD) analysis using Cu Ka radiation in the 2θ range from 20°to 60°, with a scanning step of 0.01°. The atomic force microscopy (AFM, FM-Nanoview 1000) was used to examine the surface topography.

作者：

Yifeng Hu , Haipeng You, Qingqian Chou and Tianshu Lai