si-pH-Guided Self-assembly of Copper Nanoclusters with Aggregation-Induced Emission

摘要：

This instrument was calibrated with fluorescein (QY, 88%) before the measurements. Atomic force microscope (AFM) was carried out on a S-2 FSM-Nanoview 1000 (FSM-Precision, Suzhou) in tapping mode equipped with MikroMasch NSC11 AFM tip. Transmission electron microscopy (TEM) was carried out on a JEOL JEM 2100F TEM (Japan) with an accelerating voltage of 200 kV. Scanning electron microscope (SEM) was performed on a MERLIN compact field-emission SEM (Germany). The powder structure of the CuNCs was characterized by X-ray Diffraction (XRD) using a Biller D8 Advance XRD instruments, and the value of 2 theta was in between 30 degrees to 80 degrees. Matrix-Assisted Laser Desorption/Ionization Time of Flight Mass Spectrometry (MALDI-TOF MS) measurements were performed on a Bruker Daltonics Autoflex III Smartbean MALDI-TOF MS (Germany). The spectra were collected in positive-ion mode using 3-HPA (3-Hydroxypicolinic acid) as matrix. Elemental analyzer was carried out on a Vario EL cube (Elementar, Germany).

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